Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e5db580deca7130dbe51805c6c608b35 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02B70-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-40 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H02H7-1213 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03K17-18 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H02M1-32 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H02M3-155 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G05F1-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H02M3-1588 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G05F1-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H02M3-155 |
filingDate |
2008-09-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c0c74ad3879b2ecaf89338f91a75d53a |
publicationDate |
2011-04-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
KR-20110042240-A |
titleOfInvention |
Power control circuits, power supply units, and control methods for power supply control units |
abstract |
The power supply control circuit detects the reference voltage VD which is an intermediate voltage between the "Hi Side FET" and the "Lo Side FET" at the time of the short circuit failure of the "Lo Side FET", and uses a comparator COMP to generate a threshold value. Compare "VIN-VrefH" with VD. And if the reference voltage VD is smaller than the threshold value "VIN-VrefH", and the switching control signal Hi Dr is ON, it determines with a short circuit fault. Similarly, the power supply control circuit detects the reference voltage VD of the "Hi Side FET" and the "Lo Side FET" at the time of short circuit failure of the "Hi Side FET", and uses the comparator COMP to determine the threshold value ". VrefL ”and VD are compared. And if the reference voltage VD is larger than threshold value "VrefL" and the switching control signal Lo Dr is ON, it determines with a short circuit fault. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-111684790-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20140060156-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9640980-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-200472908-Y1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11711633-B2 |
priorityDate |
2008-09-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |