http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20100028242-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_1146d1dc4ffd66d77c25805ca3f9a74f
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76801
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02126
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76224
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-76
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-31
filingDate 2008-09-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e07a2fc554c18a76166e1cf35c3c1c7d
publicationDate 2010-03-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20100028242-A
titleOfInvention Oxide film formation method of semiconductor device
abstract The present invention relates to a method of forming an oxide film of a semiconductor device, and a technical problem to be solved is to maintain a constant thickness without changing the thickness of the oxide film in the boundary region between the active region and the device isolation region.n n n To this end, the present invention provides a trench forming step of forming a trench in a semiconductor substrate, a device isolation layer forming step of forming an isolation layer by filling an insulator in the trench, and a nitride film formation forming a nitride film on the surface of the semiconductor substrate, which is the outer circumference of the device isolation layer. And an oxide film forming step of supplying radical oxygen to the nitride film to form an oxide film having a constant thickness irrespective of the crystal direction of the semiconductor substrate.
priorityDate 2008-09-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID977
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419523291
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419579069

Total number of triples: 17.