http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20090125509-A

Outgoing Links

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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 2008-06-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5b7fb202f3aff10989bd1c190894951b
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publicationDate 2009-12-07-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20090125509-A
titleOfInvention Sample holder of semiconductor type sample measuring device
abstract The present invention relates to a sample holder of a semiconductor type sample measuring apparatus, and an embodiment of the present invention provides a sample holder for measuring characteristics of a semiconductor type sample, the PCB and at least one guide pin fixed perpendicularly to the PCB; One end is coupled to the guide pin and the other end provides a sample holder of the semiconductor type sample measuring apparatus including at least one clip in contact with one side of the sample.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-108073198-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-108073198-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2015128679-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101253504-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2020226194-A1
priorityDate 2008-06-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

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Total number of triples: 27.