http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20090111883-A

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filingDate 2004-10-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_17a8889674c91044d451131e1a43c2b2
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publicationDate 2009-10-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20090111883-A
titleOfInvention Methods of restoring the hydrophobicity of low and extremely low thickness organosilicate films used as intermetallic dielectrics and articles made therefrom
abstract Often used to reduce the RC delay in integrated circuits, silica-like frameworks in which alkyl or aryl groups (to add hydrophobicity to materials and create free volume) are often attached directly to Si atoms in a network. There is a dielectric film of porous organosilicate having. Si-R bonds rarely survive exposure to plasma or chemical treatments commonly used in processing. This is especially true for materials with open cell pore structures. When the Si-R bond is broken, the material loses hydrophobicity due to the formation of hydrophilic silanol and the low dielectric constant is impaired. The present invention provides a method for restoring hydrophobicity of a material using a new class of silylating agents that may have the general formula (R 2 N) x SiR y , wherein X and Y are each an integer of 1 to 3. And an integer from 3 to 1, and R and R 'are selected from the group consisting of hydrogen, alkyl, aryl, allyl and vinyl moieties. In addition, the mechanical strength of the porous organosilicate is likewise improved as a result of the silylation treatment.
priorityDate 2004-10-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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