http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20070041161-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c16d2144a81bfa32a665dca1e93c3d37 |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-31922 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-319 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-3191 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-00 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-319 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2005-10-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_34b0cfd9c4ba9af0a9fdd3f3618b1ff8 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0d75540ce689861b29acedfad7ea31bc http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_be7e5183951ad974bacbab7fc519db8b http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e9a42947bf9c415202015d643875050a http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6a0bf76544e6c3f194fd7fc821303cef http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a0cb2aa533f69d3d98a4f920b7c5f397 |
| publicationDate | 2007-04-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | KR-20070041161-A |
| titleOfInvention | Calibration method of semiconductor test device and semiconductor test device |
| abstract | The calibration method of a semiconductor test apparatus including N (N is a natural number of 2 or more) drivers and N comparators includes: a first delay path coupled to one of the N drivers, and N N of the first calibration board. First skews between the first signals due to the N third delay paths for the N first signals transmitted over the two delay paths and the N third delay paths coupled to the N comparators Calculating, and N fourth delay paths coupled to the N drivers, N fifth delay paths of a second calibration board, and N second signals transmitted through the N third delay paths. Calculating second skews between the second signals due to the N fourth delay paths using first skews between the first signals. The timing skew of clock signals can be measured and corrected for drivers and comparators on N channels at once. Therefore, the time taken to perform calibration of the semiconductor test apparatus having a plurality of drivers and a plurality of comparators corresponding to the plurality of channels can be greatly reduced. |
| priorityDate | 2005-10-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID516892 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID453034310 |
Total number of triples: 23.