http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20070039351-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_6f1cdac90c4272d2ed510122d7153738
classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-0206
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76224
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-2652
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-76
filingDate 2005-10-07-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4720322cc575cefd63bdcc5dac2d105b
publicationDate 2007-04-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20070039351-A
titleOfInvention Manufacturing method of semiconductor device
abstract BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing a semiconductor device, and has an effect of preventing increase in junction leakage current and generation of edge moats.n n n According to an aspect of the present invention, there is provided a method of fabricating a semiconductor device, the method comprising: forming a pad nitride film exposing a field region on a semiconductor substrate; Etching the semiconductor substrate exposed by the pad nitride layer to form a trench; Forming an oxide film along the surface of the trench; Performing a nitriding process to modify the oxide film to a nitride film; Forming an HDP oxide film over the entire structure to fill the trench; CMP the upper portion of the HDP oxide film to expose the pad nitride film; Removing the pad nitride film exposed by the CMP process; And forming a well ion implantation region in the semiconductor substrate by performing a well ion implantation process.n n n n Well Ion Implantation, Junction Leakage Current, Mort
priorityDate 2005-10-07-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419579069

Total number of triples: 14.