http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20060070119-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b1007735376d07808ebe297f823b2829
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-67051
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-67017
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-6708
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3063
filingDate 2004-12-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b389b5b9102f030969c24d5bc5ae39b8
publicationDate 2006-06-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20060070119-A
titleOfInvention Semiconductor device manufacturing apparatus and method
abstract The present invention relates to an apparatus and method for manufacturing a semiconductor device, which allows the etching process to be performed by selectively using at least two kinds of etching solutions according to the progress of the etching process. In the apparatus for manufacturing a semiconductor device according to the present invention, a plurality of etching solution tanks for storing different etching solutions for etching different metal layers, a cleaning solution tank for storing a cleaning solution, and a substrate on which any one metal layer is formed are supplied. A plurality of etching process baths for etching the metal layer by receiving the etching solution from one of a plurality of etching solution tanks, and an etching solution for etching the metal layer formed on the substrate among the different etching solutions are supplied to the respective process baths. And a control unit for controlling the cleaning solution to be supplied to each of the etching process baths.n n n According to this configuration, the present invention selectively uses at least two kinds of etching solutions to etch and pattern each metal layer on the substrate in accordance with the production situation of the etching process. Accordingly, the present invention can improve the productivity by preventing the loss due to the delay of the etching process.n n n n Etching Process, Etching Solution, Process Bath, Valve, Pump
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20160083285-A
priorityDate 2004-12-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID453983605
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID180504

Total number of triples: 16.