http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20060043662-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_73b722fed27bff8cb4b26d98689a1fdc |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-07314 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2886 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0735 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2851 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-06 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 |
| filingDate | 2005-03-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5b68411c2a4605028a48d373b30313e0 |
| publicationDate | 2006-05-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | KR-20060043662-A |
| titleOfInvention | Electrical signal connection device and probe assembly and prober device using the same |
| abstract | This enables simultaneous probing tests on electronic devices or semiconductor chips with high density terminals. Therefore, as an electrical signal connection device, it has a vertical probe which makes electrical connection by contacting the electrical connection terminal made in the electrical functional element under test, and the resin film which supports the said vertical probe, The said vertical probe is a resin film surface. It is installed to be elastically deformed in the direction along the film surface, the one end of the vertical probe is in contact with the terminal of the electrical functional device under test, and the other end of the vertical probe is in contact with the terminal of the electrical functional inspection device. A signal was transmitted and received between the inspection electrical functional element and the electrical functional inspection device. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101334795-B1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20220009084-A |
| priorityDate | 2004-03-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23978 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID418354341 |
Total number of triples: 23.