http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20050114615-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_a5be2120a26ac1541644ace17a0da048 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B9-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-0024 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B27-1086 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B27-147 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-14 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-0056 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B21-14 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B17-08 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B27-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B21-00 |
| filingDate | 2004-02-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_46354075beafa2779dbaeaca1a2f14fe |
| publicationDate | 2005-12-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | KR-20050114615-A |
| titleOfInvention | Compensation for effects of mismatch in indices of refraction at a substrate-medium interface in non-confocal, confocal, and interferometric confocal microscopy |
| abstract | An interference microscope for interferometric measurement of a position within an object in a medium, wherein there is a mismatch between the object and the refractive index of the medium, the interference microscope comprising: a source for generating an incident beam; Receives the incident beam and generates a measurement beam therefrom, focuses the wing measurement beam over a selected spot in the object to produce a return measurement beam for that selected spot, and combines the return measurement beam and the reference beam to produce an interference beam; An interferometer configured to generate; A detector system arranged to receive the interference beam, the return measurement beam traveling along a path from the object to the detector system, the interferometer including a layer of compensation material positioned in the path of the return measurement beam In addition, the compensation material layer creates a mismatch of refractive indices along the path of the return measurement beam, thereby compensating for the mismatch between the refractive index of the object and the medium. |
| priorityDate | 2003-02-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 24.