Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_73ebc284a55d5daf0e209d6186c9e65c |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-0002 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-1292 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2223-54453 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-544 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-1214 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03F7-2028 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-66757 |
classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-84 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-77 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-76 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-208 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-027 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-786 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-336 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-68 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-544 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-31 |
filingDate |
2004-12-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f73120e0678b5f299cdc0bf23f658fea http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e84543d207aee71bf33975235bede81e |
publicationDate |
2005-07-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
KR-20050076596-A |
titleOfInvention |
Alignment method, method for manufacturing a semiconductor device, substrate for a semiconductor device, electronic equipment |
abstract |
It provides the most appropriate alignment method when manufacturing a device using a liquid phase process.n n n In the manufacturing process of the device including the step of forming the functional film 12 on the substrate 10 using the liquid phase method, the functional film 12 is formed on the substrate 10 on which the functional film 12 is formed. Alignment mark AM1 which shows a shape is formed with respect to the film | membrane 13 formed, and the film 13 after the said functional film 12 is aligned using the alignment mark AM1. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101104608-B1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101385141-B1 |
priorityDate |
2004-01-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |