http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20050040687-A

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filingDate 2004-05-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5e2740e8629e3ea2815f431223325f6a
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publicationDate 2005-05-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20050040687-A
titleOfInvention Test board for high frequency system level test
abstract A test board for use in high speed system level testing is disclosed. The test board of the present invention includes a main board in which through holes embedded with a conductive material are embedded in a position where an existing module socket is removed, and an interface board in which SMD-type pads are arranged on both sides. The interface board is pin-swap connected with the bottom SMD pads and the top SMD pads by cross connection of the internal wiring. Through-holes of the main board and pads of the SMD type at the lower part of the interface board are contacted and connected through iron cores fixed by the guide part. The test module sockets are surface-mounted over SMD-type pads on the top of the interface board.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-102029035-B1
priorityDate 2004-05-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 28.