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filingDate 2003-04-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_67dde1a134d50020683d26fe6c529a1a
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publicationDate 2004-10-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20040085663-A
titleOfInvention Method for manufacturing SONOS memory device with twin-ONO by reverse self-aligning process
abstract A method of manufacturing a SONOS memory device having a twin-ONO type using a reverse self-aligning process is provided. The manufacturing method according to one aspect of the present invention proposes a method in which the ONO dielectric layer is formed in a physically spaced form by an inverse magnetic matching method at the same time without being limited by the limitation of photo lithography. . Spacers are introduced to set the width of the buffer layer and the ONO dielectric layer to introduce the inverse magnetic matching scheme. Accordingly, twins that artificially limit the distribution of charge trapped during programming and erasing of SONOS memory devices to improve device characteristics, and at the same time artificially limit the spreading of charges after program / erase over time. 2-bit SONOS nonvolatile memory device can be manufactured.
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