http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20040070483-A

Outgoing Links

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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-823468
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-336
filingDate 2003-02-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f5d9253ec3573fc90f8ba0ce420c7dbd
publicationDate 2004-08-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20040070483-A
titleOfInvention Method of forming a gate in a semiconductor device
abstract Forming a gate oxide film on the semiconductor substrate; Forming a polysilicon layer on the gate oxide layer; Removing a portion of the polysilicon layer and the gate oxide film by an etching process using a reaction gas containing oxygen to form a gate electrode; Weakly removing a reaction product of oxygen and polysilicon at the sidewall of the gate oxide film; Disclosed is a method of forming a gate of a semiconductor device, the method including forming a nitride film on a sidewall of the gate oxide film by performing a plasma nitridation process.
priorityDate 2003-02-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

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Total number of triples: 16.