http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20040055463-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_1a492183be65153abfa7dec00d51c816
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-3086
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-31111
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02126
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02236
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76224
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-76
filingDate 2002-12-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_24902c8fc8da62e882c8111f992be987
publicationDate 2004-06-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20040055463-A
titleOfInvention Method for forming isolation layer in semiconductor device
abstract The present invention relates to a method of forming a device isolation film of a semiconductor device, comprising the steps of forming an antireflection film on a semiconductor substrate, forming a photoresist pattern defining a region to be separated on the antireflection film, and using the photoresist pattern as an etch barrier. Etching the anti-reflection film to expose the surface of the substrate, removing the photoresist pattern, forming a shallow trench by etching the substrate a predetermined depth with the remaining anti-reflection film as an etch barrier, and thermally oxidizing the resultant. Forming a thermal oxide film inside the trench by forming a process, forming a gapfill oxide film on the entire surface of the substrate including the thermal oxide film, etching the gapfill oxide film to expose the remaining antireflection film, and etching the antireflection film. Forming a device isolation film.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11374106-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11342441-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11342438-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11342442-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11456370-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11349011-B2
priorityDate 2002-12-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID14917
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID457280313
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID1004
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID411550722

Total number of triples: 25.