http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20040026595-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e5db580deca7130dbe51805c6c608b35
classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03F7-0757
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10S438-952
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10S438-942
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03F7-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02126
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-0275
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03F7-091
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76811
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02282
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-3122
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-0332
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02216
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03F7-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-033
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-027
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03F7-09
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03F7-075
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-312
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-768
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03F7-11
filingDate 2003-06-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6ebe8b8d3fdcf42788496d0b15ea1ec3
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_495f6fd4092e9651aecb86d3eefd7fe3
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_24ae4af68324cc7ddeaf78a009c32fb9
publicationDate 2004-03-31-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20040026595-A
titleOfInvention Process of manufacturing semiconductor device and process of forming pattern
abstract An object of the present invention is to provide a method for manufacturing a semiconductor device and a method for forming a pattern that can easily form a fine pattern with a high aspect ratio with high accuracy.n n n The manufacturing method of the semiconductor device of this invention is a manufacturing method of the semiconductor device using the laminated film for pattern formation formed on the board | substrate, The laminated film for pattern formation has a surface layer (upper layer), an inner layer (middle layer), and an innermost layer (lower layer), (A) The extinction coefficient k of the innermost layer is 0.3 or more and the extinction coefficient k of the inner layer is 0.12 or more, (B) The extinction coefficient k of the innermost layer is less than 0.3 and the extinction coefficient k of the inner layer is It is either one of 0.18 or more.
priorityDate 2002-06-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID15913
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID449266279
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID21924366
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID458392451
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID448359582

Total number of triples: 36.