| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_36f8253f3d0d59bcd9259217d4385d10 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K3-0052
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K2203-161
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K2201-09781
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K3-225
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K3-244
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K2203-107
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K2203-121
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-0002
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2223-54473 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-544
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K1-0269 |
| classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05K3-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05K3-24
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05K3-22 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-544
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05K1-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-00 |
| filingDate |
2003-05-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_24e8b37803bd6b4c5644eeff606682c1
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_cfc53dd269b5a9666904f782328abaa7
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_31f95d940d07b21babb7ae2ff350666d |
| publicationDate |
2004-02-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
KR-20040014169-A |
| titleOfInvention |
Method for marking bad parts |
| abstract |
The present invention relates to a method for indicating a defect on a system carrier for chip assembly. According to the present invention, there is provided a defective part marking method which makes it possible to make a permanent contrast marker of sufficient contrast that can be identified by an optical identification system without incurring a special cost, and to reliably avoid the occurrence of a stamp effect. do. According to the present invention, a permanent BUM label which cannot be peeled off and is clearly distinguished from the surroundings in color is used to mark the defective part on the system carrier. It may be done by removing material from the surface of the system carrier or by a deposition method. Another approach is to generate a locally defined permanent plagioclase near the surface of the substrate or metal deposited thereon in the region of the BUM label by drip heat introduction or chemical labeling. |
| priorityDate |
2002-05-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |