| abstract |
On the insulating substrate having the display area and the peripheral area, a gate line and a data line which are insulated from and cross the gate line are formed to define the display area. The driving signal line and the test signal line connected to the V off voltage application terminal are formed in the peripheral region of the insulating substrate. A drain electrode is connected to a gate electrode, a drain electrode is connected to a first inspection thin film transistor and a data line, and a source electrode is connected to any one of the test signal lines, and a gate electrode is connected to any one of the driving signal lines. And a second test thin film transistor having a source electrode connected to one of the test signal lines and a gate electrode connected to any one of the driving signal lines. As described above, the inspection wiring is connected to the gate line and the data line via the inspection TFT, and the inspection is performed. After the inspection, V off voltage is applied to the gate electrode of the inspection TFT, thereby eliminating a separate cutting process. The same state as the cut can be maintained. |