http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20030023214-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_d12f09e2e9797cb2f098f10afcf35c05
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2893
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2867
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2874
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
filingDate 2001-09-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_22ba16887b81c9aa61634ddef6972592
publicationDate 2003-03-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20030023214-A
titleOfInvention Handler for Testing Semiconductor Devices
abstract The present invention relates to a handler for testing a semiconductor device, and does not complicate the overall configuration of the handler, and allows the semiconductor device to be accurately performed at a specific temperature environment not only at room temperature but also at a high temperature and a low temperature without a complicated configuration.n n n To this end, the present invention, the loading unit is installed on the front side of the handler body is loaded with a tray containing the semiconductor elements to be tested; An unloading unit installed at one side of the loading unit to load trays for classifying and re-storing the semiconductor devices tested according to a test result; A test site positioned behind the handler body and installed to be electrically connected to an external test device, the test site including a test socket for testing a semiconductor device; A loading buffer temporarily installed on the rear side of the loading unit in a front-rear direction of the main body to temporarily mount semiconductor elements to be tested; A sorting buffer installed at a rear side of the unloading unit so as to be movable in the front-rear direction of the main body and receiving a tested semiconductor element; A first shuttle installed at a rear side of the loading unit so as to be moved forward and backward to a test socket one side to transfer the semiconductor element; A second shuttle installed at a rear side of the unloading unit so as to be moved forward and backward to a test socket other side to transfer the semiconductor element; A loading picker which is horizontally movable left and right and front and rear on an upper side of the handler main body portion in which the loading unit is installed, and supplies a semiconductor device to be tested to the loading buffer or the first shuttle; An unloading picker installed horizontally to the left and the right and the front and the back of the handler main body portion in which the unloading part is installed to classify and transfer the tested semiconductor elements of the sorting buffer to the unloading part; A first short axis picker and a second short axis picker installed to be movable to the left and right in front of the test site immediately to transfer the semiconductor element between the loading buffer and the first and second shuttles and the sorting buffer; A pair of first index heads and second index heads installed horizontally horizontally above the test site to transfer and mount semiconductor elements between the first and second shuttles and the test sockets supplied to the test site; To provide a handler for testing a semiconductor device configured.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101365097-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100748482-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100902668-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100800312-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100842929-B1
priorityDate 2001-09-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID516892
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID453034310

Total number of triples: 21.