http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20030014216-A

Outgoing Links

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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-318544
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http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-00
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-3183
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-3185
filingDate 2002-03-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2003-02-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20030014216-A
titleOfInvention Method for testing a testable electronic device
abstract A method is disclosed for testing first and second plurality of test devices, such as testable electronic devices having scan chains. The first shift register 110 may be configured to time-multiplex the first test vector 102 and the second test vector 104 into a number of smaller test vectors 102a-c; 104a-c. 130 in parallel. By varying the size of the first shift register 110 and the second shift register 130, a trade-off may occur between the multiple pins of the electronic device being coupled and the required test time. Preferably, the first shift register 110 is coupled to the first buffer register 120 and the second shift register 130 is coupled to the second buffer register for improved test data stability. The first shift register 110 and the second shift register 130 may be a division of a larger shift register, that is, a boundary scan chain. This method can also be used inversely by time-multiplexing the test result vector into a single vector on the output side of the testable electronic device.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100895591-B1
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7716545-B2
priorityDate 2001-03-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 39.