http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20030001283-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_0e7f7286c46e676b1bc0daf37b9f6c63
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2886
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-14
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-06
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 2002-06-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9d500a30a9c7e6b5888ca2790cec8eec
publicationDate 2003-01-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20030001283-A
titleOfInvention Semiconductor inspection device
abstract An inspection apparatus for inspecting a semiconductor integrated circuit which is electrically connected to an electrical element in the electrical circuit and to be assembled in the electrical circuit, before being assembled into the electrical circuit, includes a plurality of probes for contacting each exposed electrical terminal of the semiconductor integrated circuit. The probe is mounted thereon to generate a movable probe head which is relatively movable with respect to the semiconductor integrated circuit to be inspected, and a test input signal transmitted to the semiconductor integrated circuit via the probe, and then transmitted from the semiconductor integrated circuit via the probe. It has a measuring device for receiving the test output signal and inspecting the semiconductor integrated circuit.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-102266605-B1
priorityDate 2001-06-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

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Total number of triples: 20.