http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20020092731-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_1a492183be65153abfa7dec00d51c816
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76877
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-32136
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76897
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02068
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-28
filingDate 2001-06-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_11347f77f817d90392121ff34ff9a49c
publicationDate 2002-12-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20020092731-A
titleOfInvention Method for forming metal line using the dual damascene process
abstract The present invention relates to a method for forming a metal wiring using a dual damascene process to etch the seed metal layer prior to forming the plug to improve plug embedding and electrical characteristics. Forming and selectively patterning an insulating layer to define a plug formation region and an upper metal wiring formation region; Forming a barrier metal layer and a seed metal layer on a front surface; removing an overhang generated in an upper region of a plug formation region by removing a portion of the seed metal layer; forming a wire to fill the plug formation region and the upper metal wiring formation region Forming and planarizing the material layer.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100791078-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101034147-B1
priorityDate 2001-06-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

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Total number of triples: 22.