Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_f50f95c17e4934fb9f9810574cdf87aa |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C16-509 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-32082 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02126 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02274 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-32522 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-205 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02164 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02203 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02337 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-522 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J37-32 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-316 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-768 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23C16-509 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-31 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-205 |
filingDate |
2002-05-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e59e953227221e9a87ff7f21c4307efa http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_55fb12f266133a1d81bc8ff966564662 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_aea4c9bec5a6aa436398f1a7a09b0126 |
publicationDate |
2002-11-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
KR-20020086252-A |
titleOfInvention |
Method of forming low dielectric constant insulation film for semiconductor device |
abstract |
A method of forming a thin film having a low dielectric constant by a plasma reaction on a semiconductor substrate includes: (i) introducing a reaction gas into a reaction chamber for plasma CVD processing in which a semiconductor substrate is disposed on a lower stage; And (ii) forming a thin film by plasma reaction on the substrate while reducing or discharging the charge from the substrate surface. An upper region for plasma excitation and a lower region for forming a film on the substrate are formed in the reaction chamber. An intermediate electrode is used to partition the inside of the reaction chamber into the upper region and the lower region. The discharge may also be carried out by lowering the temperature of the lower stage to condense moisture molecules on the substrate surface, in particular by using a cooling plate disposed between the intermediate electrode and the lower stage. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101148431-B1 |
priorityDate |
2001-05-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |