http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20020038597-A
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2889 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-31905 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2851 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F11-22 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-319 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2000-06-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2002-05-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | KR-20020038597-A |
| titleOfInvention | Semiconductor parallel tester |
| abstract | A semiconductor parallel tester is disclosed for simultaneously testing a plurality of DUTs fixed to a handling device. The test system includes a system controller that initializes a system test signal and a pin electronics assembly that responds to the system test signal to generate a test pattern signal for application to a plurality of DUTs. The system further includes a signal interface forming a plurality of direct signal paths between the handling device and the pin electronics assembly. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100748663-B1 |
| priorityDate | 1999-06-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419491804 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5359268 |
Total number of triples: 18.