| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_1fad0246171945d5e4957c9be0b37a2f |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G09G2310-0251
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10K71-861
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10K85-346
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G09G2320-043
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G09G2300-0842
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10K59-12
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G09G2310-0256 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10K50-81
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G09G3-006
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G09G3-3233
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05B33-10 |
| classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L51-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L51-30 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G09G3-32
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05B44-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L51-52
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05B33-10 |
| filingDate |
2001-10-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_49b9045cb9f3bfb7c6562c444fbc3124
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1fa39d90fb8180723b70844f2ed0589a
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a620cfd5bc18e1c1f302a8739eefeac4 |
| publicationDate |
2002-04-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
KR-20020028830-A |
| titleOfInvention |
Method of Fabrication and Repairing a Light Emitting Device |
| abstract |
Provided is a repairing method of a light emitting device that enables high quality image display even if a pinhole is formed during forming the EL layer. The method for repairing a light emitting device is characterized in that a reverse bias voltage is applied to the EL element at regular intervals to reduce the current flowing through the EL element when this reverse bias voltage is applied to the EL element. |
| priorityDate |
2000-10-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |