http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20020013303-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b8808e580f6d582d9e0b40e253f21541
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2893
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2891
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 2000-08-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3f85e0fa2544d095930c688b275406fe
publicationDate 2002-02-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20020013303-A
titleOfInvention Semiconductor device handler system
abstract The present invention divides the temperature control region and the manual operation region of the semiconductor device handler by the integrated sub-controller, which greatly affects the processing load of the central processing unit which manages a series of processes of externally loading, testing and unloading the semiconductor device. The present invention relates to a semiconductor device handler system in which a load of a central processing unit is reduced to prevent a test process defect and a test process down due to a malfunction of the central processing unit. Overloading the central processing unit prevents process anomalies and downtime of testing semiconductor devices.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7602172-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20180119400-A
priorityDate 2000-08-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5461123
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559541

Total number of triples: 17.