http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20020013303-A
Outgoing Links
Predicate | Object |
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assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b8808e580f6d582d9e0b40e253f21541 |
classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2893 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2891 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
filingDate | 2000-08-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3f85e0fa2544d095930c688b275406fe |
publicationDate | 2002-02-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | KR-20020013303-A |
titleOfInvention | Semiconductor device handler system |
abstract | The present invention divides the temperature control region and the manual operation region of the semiconductor device handler by the integrated sub-controller, which greatly affects the processing load of the central processing unit which manages a series of processes of externally loading, testing and unloading the semiconductor device. The present invention relates to a semiconductor device handler system in which a load of a central processing unit is reduced to prevent a test process defect and a test process down due to a malfunction of the central processing unit. Overloading the central processing unit prevents process anomalies and downtime of testing semiconductor devices. |
isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7602172-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20180119400-A |
priorityDate | 2000-08-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Predicate | Subject |
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isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5461123 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559541 |
Total number of triples: 17.