http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-200148609-Y1

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_2b06cd22ab3bfbdca17825e5d731dee1
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-34
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
filingDate 1993-12-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 1999-06-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_aed3ea9a804ae0b9e837291701d4f5b2
publicationDate 1999-06-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-200148609-Y1
titleOfInvention Multibit Test Circuit of Semiconductor Memory
abstract The present invention relates to a multi-bit test circuit of a semiconductor device, and in the related art, when data is written in the test mode, all data is fixed to high or low so that data effects between neighboring cells cannot be seen. The test time is longer than the flash write mode of the present invention because only 8 data are written in multi-bit. In view of such a conventional problem, the present invention employs a flash write control unit for controlling the time and input data in the write mode so that the data to be instantaneously written in the test mode can be written to all cells in a short time. By controlling input data between neighboring cells and directly controlling the data type using address input pin or data input pin which is not used in test mode, the cell is not only high or low or fixed error but also neighboring cell in test mode. There is an effect that can detect errors caused by mutual influence between them.
priorityDate 1993-12-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID379378
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID415954990

Total number of triples: 14.