http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20000062792-A

Outgoing Links

Predicate Object
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2863
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01K1-16
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01K1-16
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 2000-03-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2000-10-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20000062792-A
titleOfInvention Semiconductor device test apparatus
abstract Provided is a semiconductor device testing apparatus that is compatible with semiconductor devices having fine pitch electrodes and has high durability. The semiconductor device test apparatus has a structure including a circuit board 103 and a film 105. In the circuit board 103, a plurality of electrodes 103c are formed at positions facing the plurality of electrodes 201a of the device under test 201. On the surface of the device under measurement 201 of the film 105, bumps 105b are formed at positions facing the plurality of electrodes 201a of the device under measurement 201. On the surface of the circuit board 103 side of the film 105, the electrode 105c is formed in the position which opposes the some electrode 103c of the circuit board 103. As shown in FIG. The bump 105b and the electrode 105c formed on the other surface of the film 105 are electrically connected through the through-hole 105d.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100455499-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20030067401-A
priorityDate 1999-03-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23985
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID482532689

Total number of triples: 15.