http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20000062792-A
Outgoing Links
Predicate | Object |
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classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2863 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01K1-16 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01K1-16 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
filingDate | 2000-03-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationDate | 2000-10-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | KR-20000062792-A |
titleOfInvention | Semiconductor device test apparatus |
abstract | Provided is a semiconductor device testing apparatus that is compatible with semiconductor devices having fine pitch electrodes and has high durability. The semiconductor device test apparatus has a structure including a circuit board 103 and a film 105. In the circuit board 103, a plurality of electrodes 103c are formed at positions facing the plurality of electrodes 201a of the device under test 201. On the surface of the device under measurement 201 of the film 105, bumps 105b are formed at positions facing the plurality of electrodes 201a of the device under measurement 201. On the surface of the circuit board 103 side of the film 105, the electrode 105c is formed in the position which opposes the some electrode 103c of the circuit board 103. As shown in FIG. The bump 105b and the electrode 105c formed on the other surface of the film 105 are electrically connected through the through-hole 105d. |
isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100455499-B1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20030067401-A |
priorityDate | 1999-03-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Predicate | Subject |
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isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23985 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID482532689 |
Total number of triples: 15.