http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-19980073666-A

Outgoing Links

Predicate Object
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76232
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-76
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-762
filingDate 1997-03-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 1998-11-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-19980073666-A
titleOfInvention Semiconductor Device Isolation Method
abstract The present invention relates to a trench isolation method, in particular, a method of stacking a first insulating film (2) and a second insulating film (3) on a semiconductor substrate (1), and the semiconductor substrate (1) Partially exposing a surface, forming a third insulating film 4 on the exposed surface of the semiconductor substrate and a second insulating film, and performing anisotropic etching on the third insulating film to form the first insulating film 2. ) And sidewall spacers 4 'made of a third insulating film on the sidewalls of the second insulating film 3, and using the second insulating film 3 and the sidewall spacers 4' as masks. Etching the semiconductor substrate 1 to a predetermined depth, removing the trench 5, removing the sidewall spacers 4 ′, and high-density plasma chemical vapor deposition oxides in the trench 5. Filling Chemical Vapor Deposition (HDP CVD oxide) (6), It provides a semiconductor device isolation structure to sequentially conduct the step of removing the first insulation film group 2 and the second insulating film 3.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20050031624-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20010078576-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100829375-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100595859-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20000066999-A
priorityDate 1997-03-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419579069

Total number of triples: 17.