http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-102480798-B1

Outgoing Links

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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-67069
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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3213
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http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-67
filingDate 2020-09-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2022-12-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2022-12-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-102480798-B1
titleOfInvention Substrate processing method and substrate processing apparatus
abstract The present invention provides a technique capable of preventing the stoppage of etching due to the generation of RuO 2 and improving the surface roughness of a ruthenium film caused by etching. A plurality of cycles including a step of reducing an oxide of the ruthenium film by supplying a hydrogen-containing gas to a substrate including a ruthenium film, and a step of oxidizing and etching the ruthenium film by supplying an oxygen-containing gas to the substrate. Substrate processing method, repeated several times.
priorityDate 2019-09-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 33.