Predicate |
Object |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-31745 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-208 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-20285 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-317 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-31 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-44 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-286 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-3023 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-32 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J37-31 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J37-317 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-28 |
filingDate |
2015-06-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2022-04-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationDate |
2022-04-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
KR-102383571-B1 |
titleOfInvention |
Automated sample-preparation device |
abstract |
The charged particle beam device 10a generates the sample piece Q based on at least the sample piece holder P, the needle 18, and the previously acquired images of a plurality of charged particle beams of the sample piece Q. A computer 21 for controlling a plurality of charged particle beam irradiation optical systems, a needle 18 and a gas supply unit 17 so as to be moved to a predetermined position of the specimen holder P is provided. |
priorityDate |
2014-06-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |