| abstract |
The alumina sintered body of the present invention has a c-plane orientation obtained according to the Rotgering method using an X-ray diffraction profile in the range of 2θ = 20° to 70° when X-rays are irradiated to the plate surface. 90% or more, the number of pores is zero when the cross section cut in the direction perpendicular to the plate surface is polished using an Ar + ion beam and a shielding plate, and then irradiated with a scanning electron microscope at a magnification of 5000 times, except for Mg and C The mass ratio of the sum of the impurity elements of is 100 ppm or less. Since this alumina sintered compact is highly oriented, high density, and high purity, it has high translucency compared with the prior art. |