http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-102328101-B1
Outgoing Links
Predicate | Object |
---|---|
classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2601 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2862 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-073 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-07371 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06733 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2875 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-07328 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2863 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-067 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073 |
filingDate | 2015-07-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate | 2021-11-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationDate | 2021-11-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | KR-102328101-B1 |
titleOfInvention | Probe card, thermal insulation cover assembly for probe card, and apparatus of testing semiconducotr device including the probe card |
abstract | The probe card includes a circuit board that transmits an electrical signal for inspection of a semiconductor device, a probe block provided on a lower surface of the circuit board and having a plurality of probes mounted thereon, and at least one of the circuit boards on the upper surface of the circuit board. and a thermal insulation cover assembly for covering a portion to form a heat receiving space and for maintaining heat applied to the circuit board in the heat receiving space. |
priorityDate | 2015-07-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 26.