http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-102175532-B1

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filingDate 2019-06-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2020-11-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_952eef9b92477f249246a0149c38985f
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publicationDate 2020-11-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-102175532-B1
titleOfInvention Method for measuring thickness and refractive index of sample using terahertz time-domain spectroscopy
abstract The present invention is configured to obtain frequencies of a terahertz signal that makes an absorption coefficient defining an amount absorbed by general air close to zero, and to measure the thickness and refractive index of a sample using a frequency set consisting of these frequencies. Therefore, it is possible to simultaneously measure and accurately measure the thickness and refractive index of a sample even in general air in which polar molecules such as moisture are present.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-114894105-A
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priorityDate 2019-06-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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Total number of triples: 26.