http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-102001057-B1

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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02F1-1368
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filingDate 2012-10-31-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2019-07-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2019-07-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-102001057-B1
titleOfInvention Method of fabricating array substrate
abstract The present invention provides a method of manufacturing a semiconductor device, comprising: forming an oxide semiconductor layer on a substrate; Forming a gate insulating film and a gate electrode sequentially stacked in correspondence with a central portion of the oxide semiconductor layer; Forming a source / drain region having improved conductivity by performing a hydrogen plasma process on the oxide semiconductor layer exposed outside the gate electrode; Forming a barrier layer having a first thickness selectively in the source drain region; Forming an interlayer insulating film having a first contact hole exposing the barrier layer over the gate electrode; And forming a source electrode and a drain electrode which are in contact with the barrier layer through the first contact hole on the interlayer insulating film, respectively.
priorityDate 2012-10-31-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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