http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-102000950-B1
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/F05D2220-31 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/F01D17-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/F01D25-24 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/F02C7-20 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2012-06-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2019-07-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2019-07-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | KR-102000950-B1 |
| titleOfInvention | Semiconductor device inspection apparatus |
| abstract | The present invention relates to an image forming apparatus, comprising: a loading unit for loading one or more trays on which a plurality of elements are loaded; A test unit including a plurality of test sockets for receiving elements from the loading unit and for testing each device; An unloading unit for classifying and loading the tested devices according to a test result of the test unit; Wherein the transfer tool transfers the elements from the loading section to the test section, or transfers the elements from the testing section to the unloading section, Wherein the third transport tools comprise a moveably mounted support, and at least one picker module detachably coupled to the support and coupled with at least one picker, And a device for inspecting the device. |
| priorityDate | 2012-02-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 16.