http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101909316-B1

Outgoing Links

Predicate Object
classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T29-49222
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06733
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-067
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R3-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06716
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2889
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-067
filingDate 2012-05-31-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2018-10-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2018-10-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-101909316-B1
titleOfInvention Probe module with interleaved serpentine test contacts for electronic device testing
abstract A probe module for inspecting an electronic device includes a first end portion extending in a first direction along a first line, a second end portion extending linearly in a second direction opposite to the first direction along a second line, And at least two contacts including a third bend extending between the first end portion and the second end portion. The first line is spaced from the second line in parallel with the second line, and the at least two contacts are spaced from each other in a direction perpendicular to the first line and the second line. Methods of forming such probe modules are also taught.
priorityDate 2011-06-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID92323602
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID433323431

Total number of triples: 19.