Predicate |
Object |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-01044 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C16-16 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C16-45561 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-205 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-0262 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-304 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C16-45523 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-0228 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-28556 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-2855 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-203 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76843 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C16-4481 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-53238 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-205 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-203 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-285 |
filingDate |
2016-02-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2018-07-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationDate |
2018-07-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
KR-101882991-B1 |
titleOfInvention |
Ruthenium film forming method, film forming apparatus, and semiconductor device manufacturing method |
abstract |
A method for forming a thin and continuous ruthenium film by CVD is provided. The ruthenium film is formed by supplying a CO gas as a carrier gas from a CO gas container 43 containing a CO gas to a film forming material container 41 containing solid ruthenium carbonyl as a film forming raw material to form ruthenium carbonyl A step of introducing a gas as a mixed gas with a CO gas into the processing vessel 1 to decompose the ruthenium carbonyl on the wafer W to form a ruthenium film and a step of stopping the introduction of the mixed gas into the processing vessel 1 And introducing CO gas from the CO gas vessel 43 directly into the processing vessel 1 to bring the CO gas into contact with the surface of the wafer W. [ Preferably, the deposition process and the CO gas introduction process are repeated a plurality of times. |
priorityDate |
2015-02-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |