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filingDate 2016-07-07-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2018-05-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2018-05-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-101862072-B1
titleOfInvention Manufacturing method of translucent thin film, manufacturing method of oxides semiconductor having absorptive characteristic of visible irradiation and oxides semiconductor therefrom
abstract The present invention provides a method of manufacturing a semiconductor device, comprising: S1: a step of forming a translucent film layer on a substrate using a non-vacuum electrodeposition; And a step S2 in which an active layer is formed on the semitransparent film layer in a non-vacuum state, wherein the preferred orientation in a specific direction is determined in the semitransparent film layer, and the active layer is grown in a specific direction determined in the semi-transparent film layer And a method of manufacturing an oxide semiconductor having an absorptive property in a visible light region. The high resistivity problem, which is a disadvantage of the p-type oxide semiconductor grown by the low temperature electrodeposition process, is solved by controlling the electrochemical growth behavior through the metal surface active agent.
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priorityDate 2016-07-07-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 38.