http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101850263-B1

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filingDate 2015-01-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2018-04-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2018-04-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-101850263-B1
titleOfInvention X-ray inspection apparatus and x-ray inspection method
abstract And detects foreign matter or the like existing in the object with high resolution and high reliability. Frame data of a plurality of fault plane parallel to the scanning direction set in the space between the X-ray tube 31 and the X-ray detecting device 22 are created based on the detected frame data. This preparation is performed in accordance with the enlargement of the fan shape of the X-ray beam and the difference in position in the height direction from the detection faces on the plurality of single layers. From the frame data of a plurality of fault plane images, a fault image is generated based on the lamination method. Edge information corresponding to a change in pixel value on each single layer is calculated for each pixel, and a three-dimensional distribution of the edge information is created. This edge information is searched in a direction passing through a plurality of fault faces. As a result of this search, a pixel indicating the maximum value of the edge information is detected, and only a plurality of pixels on the single layer corresponding to the detection pixel positionally are synthesized into one composite image.
priorityDate 2014-01-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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