http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101842814-B1

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filingDate 2014-10-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2018-03-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2018-03-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-101842814-B1
titleOfInvention Devices, systems and methods for manufacturing through-substrate vias and front-side structures
abstract Method of manufacturing a semiconductor device and a semiconductor device having a substrate-penetrating electrode (TSV). One embodiment of a method of manufacturing a semiconductor device includes forming an opening through at least a portion of a dielectric structure and a semiconductor substrate and forming a second portion on the outer surface of the lateral outer dielectric structure of the opening, Lt; RTI ID = 0.0 &gt; a &lt; / RTI &gt; dielectric liner material. The method further includes removing the conductive material to expose a second portion of the dielectric liner material and forming an inlaid conductive line in a second portion of the dielectric liner material that is electrically coupled to the TSV.
priorityDate 2013-10-31-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 32.