http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101647897-B1

Outgoing Links

Predicate Object
classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-165
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-517
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-088
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-6656
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-823475
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-66636
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76897
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76895
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76829
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-823468
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-78
filingDate 2014-12-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2016-08-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2016-08-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-101647897-B1
titleOfInvention Method of forming source/drain contact
abstract A method of manufacturing a semiconductor device is disclosed. The method includes a system for forming a gate structure on a substrate. The gate structure includes a first hard mask layer. The method also includes forming a source / drain (S / D) feature in the substrate adjacent the gate structure, forming a sidewall spacer along the sidewalls of the gate structure. The sidewall spacers have an outer edge at their upper portion in a direction away from the gate structure. The method also includes forming a second spacer along a sidewall of the gate structure and along an outer edge of the sidewall spacer, forming a dielectric layer over the gate structure, forming a sidewall spacer with the second spacer and the first hardmask layer Forming a trench extending through the dielectric layer to expose the source / drain features while the gate structure is protected by the trench. The method also includes forming a contact feature in the trench.
priorityDate 2014-10-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2000353795-A
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419524988
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419577416
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID188318
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419522147
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID142249
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419513143
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5182128
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419545842
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID448893595
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID31170
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID3468413
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID82901
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419520982
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID76871762
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419557764
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID91500

Total number of triples: 37.