http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101619309-B1
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-6462 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-61 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-076 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T436-23 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B82Y35-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B82Y30-00 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-223 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-223 |
| filingDate | 2011-09-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2016-05-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2016-05-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | KR-101619309-B1 |
| titleOfInvention | Method, system and sample for graphene defect detection |
| abstract | Techniques for methods and systems configured to be effective in detecting defects in a sample containing graphene are generally described. An exemplary method may include receiving a sample, wherein the sample may include at least some graphene and at least some of the defects in the graphene. The method may comprise exposing the sample to a gas under sufficient reaction conditions to produce a marked sample, wherein the marked sample may comprise a mark bound to at least a portion of the defect. The method may further comprise placing the marked sample in a detector system. The method may also include detecting at least a portion of the mark with a detector system. |
| priorityDate | 2011-09-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 68.