http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101420170-B1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_1a580d83718143e5d12fa805a4665f11 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0483 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0433 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2851 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06727 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R3-00 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-067 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 |
| filingDate | 2013-03-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2014-07-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8daef906ffe729f61c7a3240216e832e http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_57a34f4a8d5404b38dc015b76bba9d11 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c2a938ff418f3ce7ea6df13150c8e589 |
| publicationDate | 2014-07-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | KR-101420170-B1 |
| titleOfInvention | Contactor of test socket for semiconductor device and method of manufacturing the same |
| abstract | Disclosed is a contactor for a semiconductor device test socket using a cantilever structure that prevents damage of an electrode terminal of a semiconductor device due to physical and electrical contact between a semiconductor device and a test board during a test process of the semiconductor device. For this purpose, a plurality of patterns are formed, which are attached to the test board so as to be spaced apart from the contact terminals of the test board, and which are made of an insulative material and have a cantilever structure for inducing individual contact between the electrode terminals of the semiconductor devices and the contact terminals And an electrical contact portion provided on the pattern so as to expose both ends on the top and bottom surfaces of the pattern and to induce electrical contact between the electrode terminal and the contact terminal. According to the present invention, it is possible to prolong the lifetime of the socket by reducing the magnitude of the pressure to be applied for electrical contact between the electrode terminal of the semiconductor element and the socket, and to minimize the damage to the semiconductor element. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2018038321-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101535179-B1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101828547-B1 |
| priorityDate | 2013-03-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 29.