http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101389801-B1

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filingDate 2008-07-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2014-04-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2014-04-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-101389801-B1
titleOfInvention Method and apparatus for cleaning substrate surface
abstract The present invention generally provides an apparatus and method for forming a clean and undamaged surface on a semiconductor substrate. One embodiment of the present invention provides a system including a cleaning chamber configured to expose a surface of a substrate with a plasma cleaning process prior to forming an epitaxial layer thereon. In one embodiment, a method of reducing contamination of a processed substrate in a cleaning chamber by depositing gettering material on the interior surface of the cleaning chamber prior to performing the cleaning process on the substrate. In one embodiment, the oxidation and etching steps are repeatedly performed on the substrate of the cleaning chamber to create or expose a clean surface on the substrate that may have an epitaxial located thereon. In one embodiment, a low energy plasma is used during the cleaning step.
priorityDate 2007-07-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 45.