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filingDate 2006-03-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2014-01-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2014-01-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-101351711-B1
titleOfInvention A method for low temperature deposition of ruthenium metal layers on a substrate, computer readable media and semiconductor devices
abstract A low temperature chemical vapor deposition process for depositing low resistance ruthenium metal layers 440 and 460 that can be used as barrier / seed layers in Cu metallization techniques. The method 300 provides a process for providing substrates 25, 125 to the processing chambers 10, 110 of the deposition system 1, 100, and forming a processing gas containing ruthenium carbonyl precursor vapor and CO containing gas. And depositing the low-resistance ruthenium metal layers 440 and 460 on the substrates 25 and 125 by thermal chemical vapor deposition treatment by exposing the substrates 25 and 125 to a processing gas. (25, 125) is maintained at a temperature between about 100 ° C and about 300 ° C. A semiconductor device is provided that includes ruthenium metal layers 440, 460 formed in a patterned substrate 402, 404, 406, 408 having one or more vias or trenches 430.n n n n Chemical Vapor Deposition, Ruthenium Metal Layer, Ruthenium Carbonyl Precursor, Low Resistance
priorityDate 2005-03-31-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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