http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101333611-B1
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02F1-133784 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02F1-1309 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02F1-1337 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02F1-13 |
| filingDate | 2013-05-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2013-11-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2013-11-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | KR-101333611-B1 |
| titleOfInvention | Rubbing inspection device and rubbing inspection method using the same |
| abstract | The present invention includes forming a liquid crystal layer on the rubbed alignment layer in a substrate having a rubbing completed alignment layer; Measuring a retardation value of the substrate having the liquid crystal layer through rubbing inspection equipment; By providing a rubbing test method comprising the step of determining whether the measured retardation value is within the error range to determine whether there is a rubbing defect, the uncertainty of the rubbing test, such as the result is changed according to the ability of the conventional inspector is eliminated In addition, it is possible to determine whether the defect through the numerically quantified data, there is an effect of proceeding a stable rubbing test. |
| priorityDate | 2013-05-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 15.