http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101267842-B1
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2601 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-30 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2867 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-677 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 |
| filingDate | 2007-09-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2013-05-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2013-05-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | KR-101267842-B1 |
| titleOfInvention | Test Handler and Semiconductor Device Supply Discharge Method Using The Same |
| abstract | The present invention relates to a test handler, comprising: a test unit for testing electrical integrity of a semiconductor device under test, a loading unit supplying the semiconductor device under test to the test unit, and discharging the tested semiconductor device from the test unit; According to the test results, the unloading unit classified by grade, the semiconductor tray is delivered to the supply position provided in the loading unit and the customer device loaded with the semiconductor device to be tested and tested from the discharge position provided in the unloading unit And a tray conveying apparatus for recovering the loaded customer trays, wherein the loading unit includes a reciprocating conveying apparatus for slidingly conveying the customer tray at the supply position toward the test unit. n According to the present invention, four elements are provided for each of the supply and discharge positions of the customer tray, respectively, to recover the customer tray from the supply position or the discharge position, and then continuously transfer the other customer trays. As a result, the transfer and recovery of the customer tray can be performed quickly. In addition, it is possible to simultaneously mount and transfer the semiconductor device to the loading and unloading buffer part, thereby improving the unit per hour (UPH) by increasing the supply and discharge rate of the semiconductor device to the test part. n n Test Handlers, Trays, Semiconductors |
| priorityDate | 2007-09-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID516892 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID453034310 |
Total number of triples: 16.