http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101267841-B1
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-677 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2601 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2867 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0433 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2007-09-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2013-05-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2013-05-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | KR-101267841-B1 |
| titleOfInvention | Test Handler and Semiconductor Device Supply Discharge Method Using The Same |
| abstract | The present invention relates to a test handler, comprising: a test unit for testing an electrical quality of a semiconductor device to be tested; A loading unit supplying the semiconductor device under test to the test unit; An unloading unit configured to discharge the tested semiconductor device from the test unit and to classify the semiconductor device according to a test result according to a test result; And a tray transfer device configured to transfer the customer tray loaded with the semiconductor device under test to the loading unit and to recover the customer tray loaded with the semiconductor device under test from the unloading unit. A first loading arm for transferring the customer tray loaded with the semiconductor device under test to a supply position provided in the loading unit, a second loading arm for recovering an empty customer tray from the supply position, and a discharge position provided in the unloading unit And a first unloading arm for transferring an empty customer tray to the second unloading arm for recovering the customer tray loaded with the tested semiconductor device from the discharge position. n According to the present invention, four arms are provided in the supply position and the discharge position, respectively, each arm responsible for the transfer and recovery of the customer tray, so that the waiting time can be eliminated to avoid interference between the arms. The customer tray can be withdrawn from the discharge position and subsequently transferred to another customer tray. In addition, it is possible to simultaneously settle and transfer the semiconductor device to the loading and unloading buffer part, thereby improving the unit per hour (UPH) by increasing the supply and discharge rate of the semiconductor device to the test part. . n n Test Handlers, Trays, Semiconductors |
| priorityDate | 2007-09-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID516892 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID453034310 |
Total number of triples: 16.