http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101258474-B1

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http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-78624
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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-786
filingDate 2006-06-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2013-04-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2013-04-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-101258474-B1
titleOfInvention Semiconductor device and manufacturing method
abstract The present invention provides a TFT which does not form sidewall spacers, does not increase the number of processes, and has at least one LDD region self-aligning. According to the present invention, a photomask or a reticle having an auxiliary pattern having a light intensity reduction function formed of a diffraction grating pattern or a semi-permeable film is applied to a photolithography process for forming a gate electrode, where the film thickness is thicker, By forming an asymmetric resist pattern having thin regions on one side, forming a gate electrode having a step, implanting impurity elements into the semiconductor layer through the thin region of the gate electrode, and self-aligning LDD. Form an area.n n n n Impurity elements, self-aligning, resists, diffraction gratings.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10580902-B2
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9263507-B2
priorityDate 2005-06-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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