http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101196925-B1

Outgoing Links

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classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-214
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http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-41
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J4-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-8422
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-41
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01J4-00
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http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-84
filingDate 2004-06-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2012-11-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2012-11-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-101196925-B1
titleOfInvention Method and apparatus for three-dimensionally determining the refractive index of a transparent or partially transparent layer
abstract The present invention relates to a method and apparatus for three-dimensionally determining the refractive index and optionally the layer thickness of a transparent or partially transparent layer. According to the invention the polarized light passes through the layer 1 at different incidence angles 5 and when it passes through the layer 1 the polarization variation of the light is measured and evaluated. The method according to the invention is characterized in that the measurement is made via an immersion medium 3, in which the layer 1 is inserted between the mediums. By the method according to the invention, the refractive index of the thin anisotropic layer can be determined very accurately in a total of three spatial directions.n n n n Layer, refractive index, three-dimensional crystal, angle of incidence, polarization, immersion medium.
priorityDate 2003-06-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
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Total number of triples: 20.